By Topic

Statistical decoupling capacitance allocation by efficient numerical quadrature method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Eguia, T.J.A. ; Dept. of Electr. Eng., Univ. of California, Riverside, CA ; Ning Mi ; Tan, S.X.

In this paper, we propose a novel statistical decap allocation method to reduce the voltage drop noise in the presence of variational leakage current sources. The new method can derive the closed form of decoupling capacitance (decaps) in terms of variational parameters from the variational leakage currents. It treats the deterministic decap method as a black box and can work with any existing simulation-based methods. The new method employs the orthogonal polynomials to represent the variational gate leakages in a closed form first. Decap distributions are then computed by a fast multi-dimentional Gaussian quadrature method with sparse grid technique. Experimental results show that the proposed method can deliver order of magnitudes speedup over the Monte Carlo method with almost the same accurancy.

Published in:

Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design

Date of Conference:

16-18 March 2009