Cart (Loading....) | Create Account
Close category search window
 

Optimization of Ultrashort Pulse Generation in Passively Mode-Locked Vertical External-Cavity Semiconductor Lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Love, D. ; Interdiscipl. Grad. Program in Appl. Math., Univ. of Arizona, Tucson, AZ ; Kolesik, M. ; Moloney, J.V.

We present a genetic algorithm based method to optimize the gain medium design of a passively mode-locked vertical external-cavity surface-emitting laser (VECSEL) for ultrashort pulse generation. Beginning with a given standard VECSEL design, we show that a simple modification to the DBR within the active mirror can significantly reduce both the duration and the chirp of the generated pulse. We demonstrate, using realistic numerical simulations, that the full-width at half-maximum of the pulse can be reduced by more than a factor of two. The required design changes come at the cost of increased sensitivity to perturbations in the active chip growth. Methods of counteracting this trend are presented.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:45 ,  Issue: 5 )

Date of Publication:

May 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.