Cart (Loading....) | Create Account
Close category search window
 

Statistical Distribution of Visibilities in Digital Aperture Synthesis Radiometry

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
ZuBiao Xiong ; Dept. of Electron. & Inf. Eng., Huazhong Univ. of Sci. & Technol., Wuhan ; Fei Hu ; LiangBing Chen ; Yaoting Zhu

The statistical characteristics of visibilities measured by digital complex correlators in aperture synthesis radiometry are investigated. First, the analytic probability density function of visibilities is derived under the assumption that the successive samples are Gaussian distributed and statistically independent. However, in practice, the assumption may be not satisfied due to non-Nyquist sampling and quantizing. Then, to account for such impacts, an effective sample size is proposed. By compensating with it, the statistical distribution of visibilities is well represented in closed form. The experimental results by using an aperture synthesis millimeter-wave radiometer demonstrate the validity of the improved distribution. The results of this letter can be applied to sensitivity estimation and high-accuracy image reconstruction in digital aperture synthesis radiometry.

Published in:

Geoscience and Remote Sensing Letters, IEEE  (Volume:6 ,  Issue: 3 )

Date of Publication:

July 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.