By Topic

Sensitivity assessment of parasitic effects in second-order active-filter configurations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Fidler, J.K. ; University of Essex, Department of Electrical Engineering Science, Colchester, UK

A simple technique for the assessment of parasitic effects in second-order active-filter configurations is developed. It is shown that a knowledge of the ¿0 and Q sensitivities to the ideal (parasitic-free) components permits the straightforward computation of these effects. Results relating to capacitors, resistors, inductors, and gain components are reported.

Published in:

Electronic Circuits and Systems, IEE Journal on  (Volume:2 ,  Issue: 6 )