Cart (Loading....) | Create Account
Close category search window
 

Fault tolerance and self-checking techniques in microprocessor-based system design

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Lala, P.K. ; Syracuse University, Department of Electrical & Computer Engineering, Syracuse, USA

Fault tolerant design is receiving considerable attention at present in order to safeguard against improper operation of digital systems in critical applications. A number of multiprocessor systems featuring hardware fault tolerance are now available commercially. The paper presents an overview of some of the work done so far in the application of fault tolerance techniques to improve the reliability and availability of microprocessor-based systems. An alternative approach to enhance the reliability of a system is to apply self-checking techniques, primarily through the use of error detecting codes. By merging the fault tolerance and the self-checking techniques, the reliability and the maintainability of microprocessor-based systems can be significantly improved.

Published in:

Software & Microsystems  (Volume:4 ,  Issue: 3 )

Date of Publication:

June 1985

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.