Cart (Loading....) | Create Account
Close category search window

Review of software tools to support computer-aided testing of digital circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Bennetts, Ben ; GenRad (Fareham), Fareham, UK

This paper reviews the requirements and status of software to support the generation of test vectors for a digital circuit and the subsequent conversion into a working test program on ATE. The paper focuses on: language systems to describe circuit topology, circuit behaviour and waveforms; test pattern generation techniques; evaluation by fault simulation; postprocessing to ATE; and engineering workstation user interfaces. The conclusion comments on the need for an integrated design and test environment, based on the same tool set and data structure.

Published in:

Computer-Aided Engineering Journal  (Volume:3 ,  Issue: 4 )

Date of Publication:

August 1986

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.