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Review of software tools to support computer-aided testing of digital circuits

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1 Author(s)
Bennetts, Ben ; GenRad (Fareham), Fareham, UK

This paper reviews the requirements and status of software to support the generation of test vectors for a digital circuit and the subsequent conversion into a working test program on ATE. The paper focuses on: language systems to describe circuit topology, circuit behaviour and waveforms; test pattern generation techniques; evaluation by fault simulation; postprocessing to ATE; and engineering workstation user interfaces. The conclusion comments on the need for an integrated design and test environment, based on the same tool set and data structure.

Published in:

Computer-Aided Engineering Journal  (Volume:3 ,  Issue: 4 )

Date of Publication:

August 1986

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