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Built-In Self-Test of digital signal processors in Virtex-4 FPGAs

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2 Author(s)
Pulukuri, M.D. ; Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL ; Stroud, C.E.

We present a Built-In Self-Test (BIST) approach for testing and diagnosing the embedded digital signal processors (DSPs) in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The BIST architecture and configurations needed to test these programmable DSPs in all of their modes of operation are presented along with fault injection and timing analysis of the BIST configurations.

Published in:

System Theory, 2009. SSST 2009. 41st Southeastern Symposium on

Date of Conference:

15-17 March 2009