By Topic

Reliability and Survivability Analysis for UMTS Networks: An Analytical Approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Dharmaraja, S. ; Dept. of Math., IIT, Delhi ; Jindal, V. ; Varshney, U.

Reliability and survivability are the two important attributes of cellular networks. In the existing literature, these measures were studied through the simulation. In this paper, we construct an analytical model to determine reliability and survivability attributes of third generation and beyond Universal Mobile Telecommunication Systems (UMTS) networks. Hierarchical architecture of UMTS networks is modeled using stochastic models such as Markov chains, semi-Markov process, reliability block diagrams and Markov reward models to obtain these attributes. The model can be tailored to evaluate the reliability and survivability attributes of other beyond third generation cellular networks such as All-IP UMTS networks and CDMA2000. Numerical results illustrate the applicability of the proposed analytical model. It is observed that incorporating fault tolerance increases the network reliability and survivability. The results are useful for reliable topological design of UMTS networks. In addition, it can help the guarantee of network connectivity after any failure, without over dimensioning the networks. Moreover, it might have some impact from the point of view of the design and evaluation of UMTS infrastructures.

Published in:

Network and Service Management, IEEE Transactions on  (Volume:5 ,  Issue: 3 )