Cart (Loading....) | Create Account
Close category search window
 

Prediction of the SINR RMS in the IEEE 802.16 OFDMA System

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Moiseev, S.N. ; Kodofon, Voronezh, Russia ; Kondakov, M.S.

In this paper, we perform the prediction of the signal-to-interference-plus-noise ratio (SINR) root mean square (RMS) in the IEEE 802.16 system. We obtain the time series of the SINR RMS using system-level simulations. The SINR RMS is a heteroscedastic stochastic process. We propose a nonlinear transform of the SINR RMS that generates a linear homoscedastic stochastic process, which may be considered Gaussian in practice. We construct the prediction model of this Gaussian stochastic process using the linear autoregressive process. We propose three predictions of the SINR RMS, that is, the minimum mean square, the median, and the maximum-likelihood predictions, using the prediction of the linear autoregressive process. Our minimum mean-square error (MMSE) prediction of the SINR RMS is more reliable than the prediction based on averaging of the SINR RMS.

Published in:

Signal Processing, IEEE Transactions on  (Volume:57 ,  Issue: 8 )

Date of Publication:

Aug. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.