Cart (Loading....) | Create Account
Close category search window
 

Functional test generation for delay faults in combinational circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Pomeranz, I. ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; Reddy, S.M.

We propose a functional fault model for delay faults in combinational circuits and describe a functional test generation procedure based on this model. The proposed method is most suitable when a gate-level description of the circuit-under-test, necessary for employing existing gate-level delay fault test generators, is not available. It is also suitable for generating tests in early design stages of a circuit, before a gate-level implementation is selected. It can also potentially be employed to supplement conventional test generators for gate-level circuits to reduce the cost of branch and bound strategies. A parameter called /spl Delta/ is used to control the number of functional faults targeted and thus the number of tests generated. If /spl Delta/ is unlimited, the functional test set detects every robustly testable path delay fault in any gate-level implementation of the given function. An appropriate subset of tests can be selected once the implementation is known. The test sets generated for various values of /spl Delta/ are fault simulated on gate-level realizations to demonstrate their effectiveness.

Published in:

Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on

Date of Conference:

5-9 Nov. 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.