By Topic

Spaceborne Spotlight SAR Interferometry With TerraSAR-X

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Eineder, M. ; German Aerosp. Center, Wessling ; Adam, N. ; Bamler, R. ; Yague-Martinez, N.
more authors

Recently, synthetic aperture radar (SAR) data with 1-m resolution acquired by satellites in spotlight mode became available to the public. In this paper, we elucidate the differences between interferometric processing of strip map and of spotlight SAR data, and we outline adequate algorithms for key processing steps such as azimuth Doppler filtering. We further present first TerraSAR-X spotlight interferograms, together with an evaluation of the paraeters that are critical for interferometry. Our results indicate a very good geometric accuracy, stability, and phase fidelity of the TerraSAR-X sensor and its products. From the interferograms, we are able to determine the heights of larger buildings and millimeter-scale structural deformation in several examples. The high detail level of imaged buildings and the good temporal phase coherence of urban areas in X-band make spotlight interferometry an exciting processing technique that enables new applications such as surveying individual buildings.

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:47 ,  Issue: 5 )