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Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling

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4 Author(s)
Salman, E. ; Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA ; Friedman, E.G. ; Secareanu, R.M. ; Hartin, O.L.

A simple, yet physically intuitive macrolevel model is presented to identify the dominant substrate coupling mechanism at the early stages of the design process, while simultaneously considering multiple parameters. Furthermore, the sensitivity of substrate noise to these parameters is evaluated, demonstrating the nonmonotonic dependence of noise on rise time. The design implications of the proposed analysis are discussed, identifying the preferred noise reduction technique for a specific set of operating points.

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Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:17 ,  Issue: 10 )