By Topic

Automatic Verification Stimulus Generation for Interface Protocols Modeled With Non-Deterministic Extended FSM

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Che-Hua Shih ; Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu ; Juinn-Dar Huang ; Jing-Yang Jou

Verifying if an integrated component is compliant with certain interface protocol is a vital issue in component-based system-on-a-chip (SoC) designs. For simulation-based verification, generating massive constrained simulation stimuli is becoming crucial to achieve a high verification quality. To further improve the quality, stimulus biasing techniques are often used to guide the simulation to hit design corners. In this paper, we model the interface protocol with the non-deterministic extended finite-state machine (NEFSM), and then propose an automatic stimulus generation approach based on it. This approach is capable of providing numerous biasing strategies. Experiment results demonstrate the high controllability and efficiency of our stimulus generation scheme.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:17 ,  Issue: 5 )