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Performance-Aware Corner Model for Design for Manufacturing

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5 Author(s)
Chung-Hsun Lin ; T.J. Watson Res. Center, IBM, Yorktown Heights, NY ; Mohan V. Dunga ; Darsen D. Lu ; Ali M. Niknejad
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We present a methodology to generate performance-aware corner models (PAMs). Accuracy is improved by emphasizing electrical variation data and reconciling the process and electrical variation data. PAM supports corner (plusmnsigma and plusmn 2sigma) simulation and Monte Carlo simulation. Furthermore, PAM supports the practice of application-specific corner cards, for example, for gain-sensitive applications.

Published in:

IEEE Transactions on Electron Devices  (Volume:56 ,  Issue: 4 )