By Topic

A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Xin Bi ; Sch. of Mech. Eng., Shanghai Jiao Tong Univ., Shanghai ; Chungang Zhuang ; Han Ding

Mura is a typical vision defect of LCD panel, appearing as local lightness variation with low contrast and blurry contour. This letter presents a new machine vision inspection way for Mura defect based on the level set method. First, a set of real Gabor filters are applied to eliminating the global textured backgrounds. Then, the level set method is employed for image segmentation with a new region-based active contours model, which is an improvement of the Chan-Vese's model so that it more suitable to the segmentation of Mura. Using some results from the level set based segmentation, the defects are quantified based on the SEMU method. Experiments show that the proposed method has better performance for Mura detection and quantification.

Published in:

IEEE Signal Processing Letters  (Volume:16 ,  Issue: 4 )