By Topic

Absolute Spectral Radiation Measurements From 200-ns 200-kA X -Pinch in 10-eV–10-keV Range With 1-ns Resolution

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Leonid E. Aranchuk ; Lab. de Phys. et Technol. des Plasmas, Ecole Polytech., Palaiseau ; Jean Larour

A series of seven X-ray diodes and four Si p-i-n detectors with K- and L-filters was employed to measure the absolute time-resolved spectra of 200-ns 200-kA molybdenum and copper X-pinch plasmas. We observe a 10-mum-size 0.4-0.7-ns X-ray source at a total power yield level of 1.5 GW with about 35% in the range above 1 keV. The extreme ultraviolet part of the spectrum can be fitted by a Planckian function with a temperature of 65-75 eV. In the region above 800 eV, the spectrum can be fitted by an exponential distribution with an effective temperature of ~1 keV for Mo X-pinch and ~500 eV for Cu plasma. The X-ray source yields 200-550 mJ in this spectral range. The total XUV and X-ray yield varies in the range 10-30 J.

Published in:

IEEE Transactions on Plasma Science  (Volume:37 ,  Issue: 4 )