By Topic

How to Control AFM Nanoxerography for the Templated Monolayered Assembly of 2 nm Colloidal Gold Nanoparticles

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Ressier, L. ; Centre Nat. de la Rech. Sci. (CNRS), Univ. of Toulouse, Toulouse, France ; Palleau, E. ; Garcia, C. ; Viau, G.
more authors

This paper reports on the directed monolayered assembly of 2 nm colloidal gold nanoparticles onto charge patterns written by atomic force microscopy (AFM) on poly(methylmethacrylate) thin films with a sub-100-nm spatial resolution. The impact of key experimental parameters (surface potential of charge patterns, immersion time in the colloidal solution, nanoparticle concentration, rinsing time) on the nanoparticle assembly was quantified for the first time. This study reveals that the high level of control of this so-called AFM nanoxerography process will allow one to construct promising colloid-based devices integrating localized nanoparticle monolayers of desired density.

Published in:

Nanotechnology, IEEE Transactions on  (Volume:8 ,  Issue: 4 )