Cart (Loading....) | Create Account
Close category search window
 

The Application of a Knowledge-Based Expert System to Chemical Plant Fault Diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Palowitch, Bernard L. ; Department of Chemical Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139 ; Kramer, Mark A.

The architecture of a system for rapid, accurate diagnosis of the cause or causes of upsets in an operating chemical plant is developed. The system combines algorithmic and expert system techniques. An algorithm identifies the primary process variable deviation and an expert system lists the most probable faults that could produce that upset and recommends corrective action. The algorithm is insensitive to alarm level settings, does not depend on pre-defined alarm patterns, utilizes a modular architecture for easy adaptability to new plant settings, accounts for the dynamics of fault propagation, and can diagnose multiple faults occurring simultaneously in the plant. The expert system allows knowledge about the equipment and process to be utilized in diagnosis.

Published in:

American Control Conference, 1985

Date of Conference:

19-21 June 1985

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.