Close category search window
 

Modeling the skin effect in the time domain for the simulation of circuit interconnects

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
3 Author(s)
Magdowski, M. ; Inst. for Fundamental Electr. Eng. & Electromagn. Compatibility, Otto-von-Guericke Univ. Magdeburg, Magdeburg ; Kochetov, S. ; Leone, M.

The skin effect is characterized by a reduction of a conductor's effective cross-sectional area and is of great importance for the losses in electrical interconnection systems. Many well-known solutions exist for its modeling in the frequency domain. Based on the method of full spectrum convolution macromodeling a new skin-effect model is developed for an efficient numerical time-domain analysis. The integration of this model into the transmission line model and into the PEEC model is studied in two examples. Thereby the influence of skin effect on the simulation of interconnection systems with transient current and voltage responses is investigated.

Published in:
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on

Date of Conference: 8-12 Sept. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.