By Topic

A Markovian Dependability Model with Cascading Failures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Iyer, S.M. ; Exalead, Inc., San Francisco, CA, USA ; Nakayama, M.K. ; Gerbessiotis, A.V.

We develop a continuous-time Markov chain model of a dependability system operating in a randomly changing environment and subject to probabilistic cascading failures. A cascading failure can be thought of as a rooted tree. The root is the component whose failure triggers the cascade, its children are those components that the root's failure immediately caused, the next generation are those components whose failures were immediately caused by the failures of the root's children, and so on. The amount of cascading is unlimited. We consider probabilistic cascading in the sense that the failure of a component of type i causes a component of type j to fail simultaneously with a given probability, with all failures in a cascade being mutually independent. Computing the infinitesimal generator matrix of the Markov chain poses significant challenges because of the exponential growth in the number of trees one needs to consider as the number of components failing in the cascade increases. We provide a recursive algorithm generating all possible trees corresponding to a given transition, along with an experimental study of an implementation of the algorithm on two examples. The numerical results highlight the effects of cascading on the dependability of the models.

Published in:

Computers, IEEE Transactions on  (Volume:58 ,  Issue: 9 )