Cart (Loading....) | Create Account
Close category search window
 

Extending the Limits of Feature-Based SLAM With B-Splines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Pedraza, L. ; Intell. Control Group, Univ. Politec. de Madrid, Madrid ; Rodriguez-Losada, D. ; Matia, F. ; Dissanayake, G.
more authors

This paper describes a simultaneous localization and mapping (SLAM) algorithm for use in unstructured environments that is effective regardless of the geometric complexity of the environment. Features are described using B-splines as modeling tool, and the set of control points defining their shape is used to form a complete and compact description of the environment, thus making it feasible to use an extended Kalman-filter (EKF) based SLAM algorithm. This method is the first known EKF-SLAM implementation capable of describing general free-form features in a parametric manner. Efficient strategies for computing the relevant Jacobians, perform data association, initialization, and map enlargement are presented. The algorithms are evaluated for accuracy and consistency using computer simulations, and for effectiveness using experimental data gathered from different real environments.

Published in:

Robotics, IEEE Transactions on  (Volume:25 ,  Issue: 2 )

Date of Publication:

April 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.