Cart (Loading....) | Create Account
Close category search window
 

Computer-Aided Evaluation of Screening Mammograms Based on Local Texture Models

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Grim, J. ; Inst. of Inf. Theor. & Autom., Czech Acad. of Sci., Prague ; Somol, P. ; Haindl, M. ; Danes, J.

We propose a new approach to diagnostic evaluation of screening mammograms based on local statistical texture models. The local evaluation tool has the form of a multivariate probability density of gray levels in a suitably chosen search window. First, the density function in the form of Gaussian mixture is estimated from data obtained by scanning of the mammogram with the search window. Then we evaluate the estimated mixture at each position and display the corresponding log-likelihood value as a gray level at the window center. The resulting log-likelihood image closely correlates with the structural details of the original mammogram and emphasizes unusual places. We assume that, in parallel use, the log-likelihood image may provide additional information to facilitate the identification of malignant lesions as untypical locations of high novelty.

Published in:

Image Processing, IEEE Transactions on  (Volume:18 ,  Issue: 4 )

Date of Publication:

April 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.