By Topic

Structural optimization of contact springs of electrical connectors using response surface methodology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kun-Nan Chen ; Dept. of Mech. Eng., Tungnan Univ., Taipei ; Fu-Tsuen Gau ; Cheng-Chin Chu ; Hsien-Chie Cheng

In the present work, with the help of RSA, a minimum stress design, which minimizes the von Mises stress in the contact spring after connection, will be presented. The optimum design maximizes the reliability of the contact springs, as far as reducing the stress is concerned.

Published in:

Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on

Date of Conference:

22-24 Oct. 2008