By Topic

Tunable FIR and IIR Fractional-Delay Filter Design and Structure Based on Complex Cepstrum

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Soo-Chang Pei ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Huei-Shan Lin

A cepstrum-based approach is proposed to design finite- and infinite-impulse-response (IIR) fractional-delay (FD) filters. The maximal-flatness criteria on frequency responses are formulated as a system of linear equations to solve the truncated complex cepstrum. The closed-form solutions to cepstrum sequences can be derived. Moreover, it is very attractive that the resultant cepstrum coefficients are directly proportional to the desired FD. Under a fixed filter order, the set of normalized complex cepstra needs to be computed once and stored, and the specific set for an arbitrary FD is obtained by simply multiplying the stored set with the delay value. According to this observation, we also design two kinds of tunable filter structures consisting of several linear-phase filters, in which it is more flexible to obtain better performance by adding the extra substructure without modifying the present one. Moreover, the tunable FD is simply controlled by a single parameter, and the usage of linear-phase filters saves half of the multipliers, largely reducing the cost of hardware implementation. In addition, we obtain an IIR all-pass filter with a wider useful band than that based on Thiran's design.

Published in:

IEEE Transactions on Circuits and Systems I: Regular Papers  (Volume:56 ,  Issue: 10 )