By Topic

Calibration Method for ML Estimation of 3D Interaction Position in a Thick Gamma-Ray Detector

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hunter, W.C.J. ; Dept. of Radiol., Univ. of Washington, Seattle, WA ; Barrett, H.H. ; Furenlid, L.R.

High-energy (> 100 keV) photon detectors are often made thick relative to their lateral resolution in order to improve their photon-detection efficiency. To avoid issues of parallax and increased signal variance that result from random interaction depth, we must determine the 3D interaction position in the imaging detector. With this goal in mind, we examine a method of calibrating response statistics of a thick-detector gamma camera to produce a maximum-likelihood estimate of 3D interaction position. We parameterize the mean detector response as a function of 3D position, and we estimate these parameters by maximizing their likelihood given prior knowledge of the pathlength distribution and a complete list of camera signals for an ensemble of gamma-ray interactions. Furthermore, we describe an iterative method for removing multiple-interaction events from our calibration data and for refining our calibration of the mean detector response to single interactions. We demonstrate this calibration method with simulated gamma-camera data. We then show that the resulting calibration is accurate and can be used to produce unbiased estimates of 3D interaction position.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 1 )