Cart (Loading....) | Create Account
Close category search window
 

On-Chip Source-Follower Readout Performance With Sub-Picofarad Detector Capacitance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Castoldi, A. ; Dipt. di Elettron. e Inf., Politec. di Milano, Milan ; Guazzoni, C.

The direct integration on the high-resistivity substrate of a source-follower stage significantly improves the overall detector performance as the detector capacitance is buffered from the capacitive load of the external preamplifier. In principle this would allow full exploitation of the benefits of sub-picofarad anode capacitance (e.g., down to few tens of fF for Silicon Drift Detectors) in terms of spectroscopic resolution and processing speed. However, as the product of transconductance and output resistance of on-chip JFETs is typically limited to about 10 or even less due to technological constraints, the signal transfer of the JFET source-follower stage significantly departs from the ideal behavior, especially at sub-picofarad detector capacitances. In this paper we analyze in detail the actual performance of the on-chip source follower stage and its impact on the achievable noise and time performance of the detection system.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 1 )

Date of Publication:

Feb. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.