Cart (Loading....) | Create Account
Close category search window
 

Characterization of Head Overcoat for 1 Tb/in ^{2} Magnetic Recording

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Yasui, N. ; Production Eng. Res. Lab., Hitachi Ltd., Yokohama ; Inaba, H. ; Furusawa, K. ; Saito, M.
more authors

To achieve a 1 Tb/in2 system, diamond-like carbon (DLC) on head and disk have to meet the criteria of corrosion- and wear-resistance at thicknesses of less than 2 nm. This paper will assess the performance of head and disk overcoat for a 1 Tb/in2 system and beyond, with focus on the influence of DLC forming technologies, thickness, and substrate materials. To evaluate DLC film, sp3 fraction was measured by X-ray photoelectron spectroscopy (XPS). It was shown that DLC films fabricated by filtered cathodic vacuum arc (FCVA) would have less sp3 fraction with decreasing thickness. To evaluate corrosion- and wear-resistance, coverage and critical loads were measured by XPS and atomic force microscopy scratch test. XPS revealed that DLC films prepared by both FCVA and ion-assisted sputtering had sufficient coverage at thickness of down to 1 nm. Atomic force microscopy scratch test showed that critical load depends on substrate materials and DLC thickness, not on DLC forming methods.

Published in:

Magnetics, IEEE Transactions on  (Volume:45 ,  Issue: 2 )

Date of Publication:

Feb. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.