Cart (Loading....) | Create Account
Close category search window
 

A Complete Noise- and Scattering-Parameters Test-Set

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Garelli, M. ; Dept. of Electron., Politec. di Torino, Turin ; Ferrero, A. ; Bonino, S.

We present an innovative test-set based on a microwave tuner, a vector network analyzer and a Y-factor receiver capable of extracting the noise and the scattering parameters of a two-port device. To the authors' knowledge, the presented test-set is the first noise system that avoids the use of any microwave switch in the noise measurement branches. A set of reflectometers and a novel calibration scheme are used to measure the tuner's loss and S-parameters in real time without any tuner precharacterization.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:57 ,  Issue: 3 )

Date of Publication:

March 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.