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A Complete Noise- and Scattering-Parameters Test-Set

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3 Author(s)
Garelli, M. ; Dept. of Electron., Politec. di Torino, Turin ; Ferrero, A. ; Bonino, S.

We present an innovative test-set based on a microwave tuner, a vector network analyzer and a Y-factor receiver capable of extracting the noise and the scattering parameters of a two-port device. To the authors' knowledge, the presented test-set is the first noise system that avoids the use of any microwave switch in the noise measurement branches. A set of reflectometers and a novel calibration scheme are used to measure the tuner's loss and S-parameters in real time without any tuner precharacterization.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:57 ,  Issue: 3 )

Date of Publication:

March 2009

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