Cart (Loading....) | Create Account
Close category search window
 

3D Tomographic and Differential Tomographic Response to Partially Coherent Scenes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lombardini, F. ; Dept. of Inf. Eng., Univ. of Pisa, Pisa ; Cai, F.

Much interest is continuing to grow in advanced SAR methods for full 3D imaging of volumetric scatterers, in particular forests. Multibaseline SAR tomographic elevation beam forming is a promising technique in this framework. In this paper, the effect of temporal decorrelation during the repeat pass multibaseline acquisition on the advanced adaptive elevation beam forming tomography is analyzed, using a simple temporal decorrelation model. Also, the response of the recently introduced differential tomography technique, producing "space-time" signatures of scattering phenomena in the SAR cell, is investigated in the same conditions. Finally, first analyses of tomography robust to some temporal decorrelation phenomena through differential tomographic processing are carried out for simulated temporal decorrelating volumetric scatterers. Preliminary differential tomography results with real L-band forest data are also presented.

Published in:

Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International  (Volume:2 )

Date of Conference:

7-11 July 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.