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BIT optimization design of airborne electronic equipment based on reliability

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4 Author(s)
Ma Cun-bao ; Sch. of Aeronaut., Northwestern Polytech. Univ., Xian ; Wang Yan-Wen ; Zhang Wei ; Shi Hao-shan

Built-in test (BIT) has direct or indirect influence on reliability, maintainability, availability, lifecycle cost of the airborne electronic equipment. In this paper, we present a BIT optimization design approach based on the reliability. The impact of BIT on the system reliability is analyzed, and the BIT optimization design approach is mainly discussed. In the following, the NLIP (Non-Linear Integer Programming) model of the BIT optimization design is addressed, a demonstration results show that the system reliability and the performance of the BIT design are improved by the proposed approach.

Published in:

Systems and Control in Aerospace and Astronautics, 2008. ISSCAA 2008. 2nd International Symposium on

Date of Conference:

10-12 Dec. 2008