By Topic

Thickness scalability of large volume Cadmium Zinc Telluride high resolution radiation detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

14 Author(s)
Awadalla, S.A. ; Redlen Technologies, Sidney, BC V8L 5Y8 Canada ; Chen, H. ; Mackenzie, J. ; Lu, P.
more authors

In an effort to optimize the spectroscopic performance of large volume Cadmium Zinc Telluride (CZT) radiation detectors grown by the Traveling Heater Method (THM), especially for higher energy gamma detection applications, bulk material and pixellated detector performance of THM CZT crystals at 15mm-thick and 10mm-thick were compared to that at 5mm-thick. We demonstrate that the outstanding performance of monolithic pixellated THM CZT detectors was thickness-scalable. For the same monolithic 20×20 mm2 “Compton Camera” pixellated detector configuration, detector performance can certainly be significantly improved as the thickness of the detector increases from 5mm to 10mm and thicker as demonstrated via both 57Co 122 keV and 137Cs 662 keV spectral responses. Depth of interaction information obtained from 3D depth sensing measurement system, IR microscopy and x-ray topography were used to study the correlation between structural quality and detector performance. Additional material characterizations and detector performances of various sizes and configurations were also presented and discussed.

Published in:

Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE

Date of Conference:

19-25 Oct. 2008