Cart (Loading....) | Create Account
Close category search window
 

Experiences with the ATLAS pixel detector optolink and researches for future links

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

11 Author(s)
Flick, T. ; Physics Department of University Wuppertal, Gaußstr. 20, 42119, Germany ; Dopke, J. ; Arguin, J.-F. ; Gemme, C.
more authors

The optical links for the ATLAS Pixel detector has been passed several steps of development. After the design and production of the components itself, various tests have been performed on individual components on smaller or larger parts of the full system. Finally, the links were commissioned in situ after installation. A lot of experience has been gained and this should be used to step into the research on future optical links for the Pixel detector itself, but also for other detectors. In this paper the procedure of the commissioning work of the ATLAS Pixel optical link and observed issues on the system layout and function are discussed and brought into an outlook for future optical link designs.

Published in:

Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE

Date of Conference:

19-25 Oct. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.