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This paper deals with the fine tuning of high voltage circuits parameters for impulse voltage tests. The equipment involved in the test is prior subjected to a frequency domain fitting based on vector fitting (VF) and later implemented in ATP-EMTP. The simulation results are used to verify the adequacy of the actual experimental tests. Comparison between experimental and simulated setup indicate that the deviations are below the lever of the uncertainties of the measuring systems.
Date of Conference: 9-12 Nov. 2008