Cart (Loading....) | Create Account
Close category search window

Robust Scale-Invariant Feature Matching for Remote Sensing Image Registration

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Qiaoliang Li ; Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan ; Guoyou Wang ; Jianguo Liu ; Shaobo Chen

When the scale-invariant feature transform (SIFT) is adopted in the registration of remote sensing images, a lot of incorrect matches of keypoints will appear owing to the significant difference in the image intensity between remote sensing images compared to visible images. Scale-orientation joint restriction criteria are proposed to achieve robust feature matching for keypoints in remote sensing images. Moreover, the feature descriptor of each keypoint is also refined to overcome the difference in the gradient intensity and orientation between remote image pairs. Experimental results for multidate, multispectral, and multisensor remote images indicate that the proposed method improves the match performance compared to intensity- and SIFT-based methods in terms of correct-match rate and aligning accuracy.

Published in:

Geoscience and Remote Sensing Letters, IEEE  (Volume:6 ,  Issue: 2 )

Date of Publication:

April 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.