Cart (Loading....) | Create Account
Close category search window
 

A New Algorithm for Image Edge Extraction Using a Statistical Classifier Approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kundu, A. ; Department of Electrical Engineering, State University of New York, Amherst Campus, Buffalo, NY 14260. ; Mitra, Sanjit K.

This correspondence describes a new algorithm for extracting edges from natural images. Starting from a simple image model, the algorithm poses the problem of edge extraction as a statistical classifier problem. The algorithm is capable of extracting and detecting edges from images even in the presence of noise. A step by step mathematical derivation of the algorithm reveals the flexibility of the algorithm with pertinent parameters that can be varied for the specific need of the user. Finally, the proposed edge operator is compared to the well-known Marr-Hildreth's edge operator.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:PAMI-9 ,  Issue: 4 )

Date of Publication:

July 1987

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.