Cart (Loading....) | Create Account
Close category search window
 

On the Straightness of Digital Arcs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Hung, S.H.Y. ; Division of Electrical Engineering, National Research Council of Canada, Ottawa, Ont., Canada KIA 0R8.

The straightness of a digital arc can simply be determined by the absence of unevenness in its chain code. The absence of unevenness is a necessary and sufficient condition for a digital arc to have the chord property, and it offers a much simpler alternative for examining whether a digital arc has the chord property or not. This condition is also the most comprehensive and precise expression of the third criterion about digital straight lines given by Freeman. The relations among the chord property, Freeman's three criteria, and the hierarchical structure that a digital straight line supposedly have become much more clear. A procedure to detect the uneven segments and algorithms for determining the straightness of digital arcs is also included.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:PAMI-7 ,  Issue: 2 )

Date of Publication:

March 1985

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.