Cart (Loading....) | Create Account
Close category search window
 

Contextual Template Matching: A Distance Measure for Patterns with Hierarchically Dependent Features

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ben-Bassat, Moshe ; Faculty of Management, Tel Aviv University, Tel Aviv 69978, Israel; Institute of Critical Care Medicine, University of Southern California, Los Angeles, CA 90003. ; Zaidenberg, Lev

Contextual template matching refers to situations where the feature sets of the two templates under consideration may not be identical, but are rather contingent on the context within which these templates are observed. This paper addresses context-dependent template matching where the relevancy of certain features to a given object is contingent on the value of higher level features. In such situations portions of the patterns for two objects X and Y may not be comparable, and therefore classical distance measures are not applicable. A framework for describing pattern spaces with hierarchically dependent features-named conditional pattern spaces (CPS)-is presented, and a distance measure for comparing objects in a CPS is developed and illustrated on archaeological objects. This measure satisfies several desired properties of distance measures, such as the metric requirements.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:PAMI-6 ,  Issue: 2 )

Date of Publication:

March 1984

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.