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Browse Journals & Magazines > Pattern Analysis and Machine ...> Volume:PAMI-4 Issue:6 Help

Shape Measurement of Curved Objects Using Multiple Slit-Ray Projections

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3 Author(s)
Sato, Yukio ; Department of Electronic Engineering, Tokyo University of Agriculture & Technology, Koganei, Tokyo, Japan. ; Kitagawa, Hiroo ; Fujita, Hiroichi

A method for the shape measurement of curved objects has been developed using multiple slit-ray projections and a turntable. The object is placed on a computer-controlled turntable and irradiated by two directed slit-ray projectors. An ITV camera takes a line image of the reflection from the object, and a computer calculates the space coordinates of the object surface. By using multiple projections, the total shape measurement of the object surface is attained accurately.

Published in:
Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:PAMI-4 ,  Issue: 6 )

Date of Publication: Nov. 1982

Page(s):
641 - 646
ISSN :
0162-8828
Digital Object Identifier :
10.1109/TPAMI.1982.4767318
Product Type:
Journals & Magazines
Date of Current Version :
27 January 2009
Issue Date :
Nov. 1982
Sponsored by :
IEEE Computer Society

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