By Topic

Feature Extraction Using Problem Localization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Short, Robert D. ; Sperry Research Center, Sudbury, MA 01776. ; Fukunaga, Keinosuke

Feature extraction is considered as a mean-quare estimation of the Bayes risk vector. The problem is simplified by partitioning the distribution space into local subregions and performing a linear estimation in each subregion. A modified clustering algorithm is used to fimd the partitioning which minimizes the mean-square error.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:PAMI-4 ,  Issue: 3 )