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Two New Edge Detectors

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2 Author(s)
Jacobus, Charles J. ; Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801; Texas Instruments, Inc., Dallas, TX 75265. ; Chien, Robert T.

This paper introduces two new edge detection algorithms. One uses multiple difference-based edge detectors. This scheme selects peak center by absolute maximum or center of mass techniques. The other algorithm is motivated by the observation that second-order enhancement improves human contour extraction, but generally confuses difference-based edge detectors. This algorithm translates intensity images into three state images (plus one, zero, and minus one), then uses multiple three-state edge masks to find edge positions. The second scheme has a multiple hardware implementation and interesting biological analogs. Finally, the two operators introduced are compared to some popular edge detection techniques from the literature.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:PAMI-3 ,  Issue: 5 )

Date of Publication:

Sept. 1981

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