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Statistical Pattern Classification with Binary Variables

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3 Author(s)
Tzay Y. Young ; SENIOR MEMBER, IEEE, Department of Electrical Engineering, University of Miami, Coral Gables, FL 33124. ; Philip S. Liu ; Romulo J. Rondon

Binary random variables are regarded as random vectors in a binary-field (modulo-2) linear vector space. A characteristic function is defined and related results derived using this formulation. Minimax estimation of probability distributions using an entropy criterion is investigated, which leads to an A-distribution and bilinear discriminant functions. Nonparametric classification approaches using Hamming distances and their asymptotic properties are discussed. Experimental results are presented.

Published in:

IEEE Transactions on Pattern Analysis and Machine Intelligence  (Volume:PAMI-3 ,  Issue: 2 )