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I am writing this in mid-August during my annual summer visit to my parents in New York. In an attempt to absorb some culture and to expose my children to some culture, my family and I have been visiting some of the museums on the eastern seaboard. Yesterday, we went to the Metropolitan Museum of Art in Manhattan. It was the fi rst time my daughters, ages six and ten, had been there. They got a real kick out of some of the exhibits (though they wanted to go home long before their mom did).

Published in:

Instrumentation & Measurement Magazine, IEEE  (Volume:12 ,  Issue: 1 )