Close category search window
 

Extraction of shoe-print patterns from impression evidence using Conditional Random Fields

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ramakrishnan, V. ; Dept. of Comput. Sci. & Eng., State Univ. of New York, Amherst, NY ; Sargur Srihari

Impression evidence in the form of shoe-prints are commonly found in crime scenes. A critical step in automatic shoe-print identification is extraction of the shoe-print pattern. It involves isolating the shoe-print foreground (impressions made by the shoe) from the remaining elements (background and noise). The problem is formulated as one of labeling the regions of a shoeprint image as foreground/background. It is formulated as a machine learning task which is approached using a probabilistic model, i.e., conditional random fields (CRFs). Since the model exploits the inherent long range dependencies that exist in the shoe-print it is more robust than other approaches, e.g., neural networks and adaptive thresholding of grey-scale images into binary. This was demonstrated using a data set of 45 shoeprint image pairs representing latent and known shoe-print images.

Published in:
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on

Date of Conference: 8-11 Dec. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.