Cart (Loading....) | Create Account
Close category search window

Efficient MRF approach to document image enhancement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Obafemi-Ajayi, T. ; Illinois Inst. of Technol., Chicago, IL ; Agam, G. ; Frieder, O.

Markov random field (MRF) based approaches have been shown to perform well in a wide range of applications. Due to the iterative nature of the algorithm, the computational cost of such applications is normally high. In the context of document image analysis, where numerous documents have to be processed, this computational cost may become prohibitive. We describe a novel approach to document image enhancement using MRF.We show that by using domain specific knowledge, we are able to substantially improve computational performance by an order of magnitude. Moreover, in contrast to known techniques where patch initialization is arbitrary, in the proposed approach patch initialization is data consistent and so results in improved effectiveness. Experimental results comparing the proposed approach to known techniques using historical documents from the Frieder Collection are provided.

Published in:

Pattern Recognition, 2008. ICPR 2008. 19th International Conference on

Date of Conference:

8-11 Dec. 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.