Referenced Items are not available for this document.
This workshop has established itself as an important event for scientists involved in the combined fields of pattern recognition and remote sensing. These two research fields have always overlapped, but the large volumes of remote sensing data now coming from last generation sensors require new advanced algorithms and techniques for automatic analysis. This one-day workshop will be the ideal means to spread and exchange experiences by international researchers.
Published in:
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Date of Conference: 8-11 Dec. 2008
- Page(s):
- 1
- ISSN :
- 1051-4651
- E-ISBN :
- 978-1-4244-2175-6
- Print ISBN:
- 978-1-4244-2174-9
- Conference Location :
- Tampa, FL, USA
- Digital Object Identifier :
- 10.1109/ICPR.2008.4760945
- Product Type:
- Conference Publications
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