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An integration scheme for image segmentation and labeling based on Markov random field model

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2 Author(s)
I. Y. Kim ; Micro Devices Business, Samsung Electronics Co. Ltd., Buchun, South Korea ; H. S. Yang

This paper presents a unified approach for the image understanding problem based on the Markov random field models. In the proposed scheme, the image segmentation and interpretation processes cooperate in the simultaneous optimization process so that the erroneous segmentation and misinterpretation can be compensatedly recovered by continuous estimation of the unified energy function

Published in:

IEEE Transactions on Pattern Analysis and Machine Intelligence  (Volume:18 ,  Issue: 1 )