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A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)]

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1 Author(s)
Davidson, Scott ; Sun Microsystems

This is a review of System on Chip Test Architectures: Nanometer Design for Testability (edited by Laung-Terng Wang, Charles E. Stroud, and Nur A. Touba). Overall, this is a good guide to the frontiers of test. For most of the chapters, the selection of subjects and the detail level is just right, largely because this book is a follow-on to a more introductory book, VLSI Test Principles and Architectures. If one of the more basic books on testing is not adequate for your requirements, this text would make a nice addition to your library. It would also do well as a text in an advanced graduate course.

Published in:

Design & Test of Computers, IEEE  (Volume:26 ,  Issue: 1 )