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Improved Core Isolation and Access for Hierarchical Embedded Test

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3 Author(s)
Nadeau-Dostie, B. ; LogicVision, SanJose, CA ; Adham, S.M.I. ; Abbott, R.

IEEE Std 1500 enables automation and hence allows for easier and faster integration of embedded cores into an SoC. This article describes an automated test development system based on the concept of embedded test.

Published in:

Design & Test of Computers, IEEE  (Volume:26 ,  Issue: 1 )