By Topic

Reliability prediction using nondestructive accelerated-degradation data: case study on power supplies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Loon Ching Tang ; Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore ; Dong Shang Chang

This paper describes a conceptual framework for reliability evaluation from nondestructive accelerated degradation data (NADD). A numerical example of data sets from power supply units for electronic products is presented using this framework. The authors model NADD as a collection of stochastic processes for which the parameters depend on the stress levels. The relationship between these parameters and the associated stresses is explored using regression. The failure-time of power-supply units is modeled by the Birnbaum-Saunders distribution, for which the confidence bounds and tolerance limits can be easily obtained

Published in:

IEEE Transactions on Reliability  (Volume:44 ,  Issue: 4 )